삼성전자 반도체 사업부에서 채용관련 연락을 받고 게시판에 공지합니다.
관심있으신 분들은 밑에 내용을 참고하시기 바랍니다.
=====================================================================================
안녕하세요.
Technology를 선도하는 삼성전자 반도체사업부 메모리담당 채용담당자 신홍진입니다.
다음과 같이 반도체 및 관련
전공자 분들을 모시고자 합니다.
- 다 음 -
1.
모집대상 : 박사학위 기취득자 및 '11~'12년 학위취득 예정자
2. 지원방법
○ 지원기간 : ~ 10월
15일(금)
○ 지원방법 : hongjin.shin@samsung.com 으로 이력서 접수
3. 모집분야
●
Hardware Design
- DRAM(DDR/Mobile/Graphic), Flash memory(Nor/Nand), PRAM,
Analog & Digital Circuit
- Memory Card Controller : RTL Coding,
Synthesis, Static Timing Analysis,
AMBA-based bus protocol &
ARM-based SoC chip design, DFT Implementation
SATA, SAS, PCIe,
USB2.0/3.0, SD/MMC interface,
ARM-based embedded SW development & HW
validation,
System Verilog Verification, FPGA Implementation &
Verification,
Signal Processing Algorithm Development for Memory &
Storage System,
Channel Codes(Error Detection/Correction Codes) Design
& HW/FW IP Design
● Software Design
System SW, Computer
Architecture, Memory & Storage Algorithm Design,
FTL, Flash Memory
File System, Journaling File System Design,
Virtual Memory Management,
Cache Algorithm, Dynamic Memory Management Development,
Application
Processor, Multimedia Processor, Memory Card Controller F/W,
Inter-Processor Communication Algorithm Design,
Parallel Processing
Algorithm for SMP/AMP multi-Processor,
HW & SW Performance Trade-off,
SW Engineering,
Embedded System Test, Test Case Design, Dependability,
Fault Tolerant System Test
Embedded System Development Process,
Performance Analysis, OS, I/O System, Storage System,
Infra(Clear Case,
Clear Quest, Test Automation Tool)
● Device Process
Oxidation, Photo
Resist, Photolithography, Etch, Diffusion, Cleaning, Thin Film,
Ion
Impantation, CVD, Metallization, Device Isolation, Transistor, Capacitor,
Dielectric, SiO2/SiON Gate Dielectrics, High-K/Metal Gate, Device Analysis
●
Manufacturing Technology
- Yield Enhancement: Defect Reduction,
Contamination Evaluation Technology,
Particle Detection, Gas Impurity
Evaluation Technology, Surface/Chemical
Analysis Technology,
Contamination Technology
- Metrology:Pattern Process Inspection, Critical
Dimension Measurement
● Quality & Reliability Engineering for
Semiconductor
Accelerated Life/Degradation Test Modeling
&Analysis,
System/Software Reliability & Warranty
Engineering,
Virtual Metrology & APC (Advanced Process Control)
Modeling,
Multi-Stage SPC (Statistical Process Control) and/or DOE (Design
of Experiment),
Multivariate Modeling & Analysis (include Data Mining
Methodology),
Sampling & Measurement Risk Modeling under Automated
Dispatching System
● Reliability Technology for Semiconductor
Device
Reliability(DRAM, Flash), Advanced Gate Stack Reliability,
Novel Device
Reliability(PCM, MRAM, etc), Device Characterization and Reliability
Modeling,
Design-In Reliability, Interconnect Reliability,
Electro-migration, Stress-migration,
BTS (Bias Temperature Stress), 3D
interconnect, Thin Film Stress analysis,
Novel Materials for Interconnects
Circuit Reliability, Failure Analysis & Life Time Projection ,
Package
level reliability, Solder joint reliability, Board level reliability
4.
기타
○ 이력서 검토 후에 개별적으로 연락을 드리겠으며, 10월말~11월초에 현지면접을 진행할 예정입니다.
세부일정 및 장소에
대해서는 추후에 자세히 안내해 드리겠습니다.
○ 궁금하신 사항은 언제든지 문의주시기 바랍니다.
- 담당자 : 신홍진(hongjin.shin@samsung.com, +82-31-208-6062)